radiation effects on embedded systems

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Radiation Effects On Embedded Systems

Author : Raoul Velazco
ISBN : 9781402056468
Genre : Technology & Engineering
File Size : 49. 91 MB
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This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.

Rugged Embedded Systems

Author : Augusto Vega
ISBN : 9780128026328
Genre : Computers
File Size : 87. 81 MB
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Rugged Embedded Systems: Computing in Harsh Environments describes how to design reliable embedded systems for harsh environments, including architectural approaches, cross-stack hardware/software techniques, and emerging challenges and opportunities. A "harsh environment" presents inherent characteristics, such as extreme temperature and radiation levels, very low power and energy budgets, strict fault tolerance and security constraints, etc. that challenge the computer system in its design and operation. To guarantee proper execution (correct, safe, and low-power) in such scenarios, this contributed work discusses multiple layers that involve firmware, operating systems, and applications, as well as power management units and communication interfaces. This book also incorporates use cases in the domains of unmanned vehicles (advanced cars and micro aerial robots) and space exploration as examples of computing designs for harsh environments. Provides a deep understanding of embedded systems for harsh environments by experts involved in state-of-the-art autonomous vehicle-related projects Covers the most important challenges (fault tolerance, power efficiency, and cost effectiveness) faced when developing rugged embedded systems Includes case studies exploring embedded computing for autonomous vehicle systems (advanced cars and micro aerial robots) and space exploration

Radiation Effects In Semiconductors

Author : Krzysztof Iniewski
ISBN : 1439826951
Genre : Technology & Engineering
File Size : 71. 23 MB
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Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.

Cryptographic Hardware And Embedded Systems Ches 2017

Author : Wieland Fischer
ISBN : 9783319667874
Genre : Computers
File Size : 60. 54 MB
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This book constitutes the proceedings of the 19th International Conference on Cryptographic Hardware and Embedded Systems, CHES 2017, held in Taipei, Taiwan, in September 2017. The 33 full papers presented in this volume were carefully reviewed and selected from 130 submissions. The annual CHES conference highlights new results in the design and analysis of cryptographic hardware and soft- ware implementations. The workshop builds a valuable bridge between the research and cryptographic engineering communities and attracts participants from industry, academia, and government organizations.

Fault Injection Techniques And Tools For Embedded Systems Reliability Evaluation

Author : Alfredo Benso
ISBN : 9780306487118
Genre : Technology & Engineering
File Size : 43. 46 MB
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This is a comprehensive guide to fault injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different fault injection techniques and tools are authored by key scientists in the field of system dependability and fault tolerance.

Terrestrial Radiation Effects In Ulsi Devices And Electronic Systems

Author : Eishi H. Ibe
ISBN : 9781118479322
Genre : Technology & Engineering
File Size : 85. 63 MB
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This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.

Fundamentals Of Radiation Materials Science

Author : Gary S. Was
ISBN : 9781493934386
Genre : Technology & Engineering
File Size : 66. 12 MB
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The revised second edition of this established text offers readers a significantly expanded introduction to the effects of radiation on metals and alloys. It describes the various processes that occur when energetic particles strike a solid, inducing changes to the physical and mechanical properties of the material. Specifically it covers particle interaction with the metals and alloys used in nuclear reactor cores and hence subject to intense radiation fields. It describes the basics of particle-atom interaction for a range of particle types, the amount and spatial extent of the resulting radiation damage, the physical effects of irradiation and the changes in mechanical behavior of irradiated metals and alloys. Updated throughout, some major enhancements for the new edition include improved treatment of low- and intermediate-energy elastic collisions and stopping power, expanded sections on molecular dynamics and kinetic Monte Carlo methodologies describing collision cascade evolution, new treatment of the multi-frequency model of diffusion, numerous examples of RIS in austenitic and ferritic-martensitic alloys, expanded treatment of in-cascade defect clustering, cluster evolution, and cluster mobility, new discussion of void behavior near grain boundaries, a new section on ion beam assisted deposition, and reorganization of hardening, creep and fracture of irradiated materials (Chaps 12-14) to provide a smoother and more integrated transition between the topics. The book also contains two new chapters. Chapter 15 focuses on the fundamentals of corrosion and stress corrosion cracking, covering forms of corrosion, corrosion thermodynamics, corrosion kinetics, polarization theory, passivity, crevice corrosion, and stress corrosion cracking. Chapter 16 extends this treatment and considers the effects of irradiation on corrosion and environmentally assisted corrosion, including the effects of irradiation on water chemistry and the mechanisms of irradiation-induced stress corrosion cracking. The book maintains the previous style, concepts are developed systematically and quantitatively, supported by worked examples, references for further reading and end-of-chapter problem sets. Aimed primarily at students of materials sciences and nuclear engineering, the book will also provide a valuable resource for academic and industrial research professionals. Reviews of the first edition: "...nomenclature, problems and separate bibliography at the end of each chapter allow to the reader to reach a straightforward understanding of the subject, part by part. ... this book is very pleasant to read, well documented and can be seen as a very good introduction to the effects of irradiation on matter, or as a good references compilation for experimented readers." - Pauly Nicolas, Physicalia Magazine, Vol. 30 (1), 2008 “The text provides enough fundamental material to explain the science and theory behind radiation effects in solids, but is also written at a high enough level to be useful for professional scientists. Its organization suits a graduate level materials or nuclear science course... the text was written by a noted expert and active researcher in the field of radiation effects in metals, the selection and organization of the material is excellent... may well become a necessary reference for graduate students and researchers in radiation materials science.” - L.M. Dougherty, 07/11/2008, JOM, the Member Journal of The Minerals, Metals and Materials Society.

Fpgas And Parallel Architectures For Aerospace Applications

Author : Fernanda Kastensmidt
ISBN : 9783319143521
Genre : Technology & Engineering
File Size : 67. 36 MB
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This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.

Programming Embedded Systems

Author : Michael Barr
ISBN : 9780596009830
Genre : Computers
File Size : 70. 32 MB
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Authored by two of the leading authorities in the field, this guide offers readers the knowledge and skills needed to achieve proficiency with embedded software.

From Specification To Embedded Systems Application

Author : Achim Rettberg
ISBN : 0387275576
Genre : Computers
File Size : 32. 92 MB
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IFIP TC10 Working Conference: Internationall Embedded Systems Symposium (IESS), August 15-17, 2005, Manaus, Brazil

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