introduction to texture analysis macrotexture microtexture and orientation mapping second edition

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Introduction To Texture Analysis

Author : Olaf Engler
ISBN : 1420063669
Genre : Science
File Size : 41. 99 MB
Format : PDF, ePub
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The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, practices, and applications of techniques used to determine and characterize texture. Providing a clear focus on scientific principles, this reference keeps mathematics to a minimum in covering both traditional macrotexture analysis and more modern electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book is organized into three sections: Fundamental Issues addresses terminology associated with orientations and texture, in addition to their representation. It also covers the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis. Macrotexture Analysis covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis. Microtexture Analysis provides experimental details of the transmission or scanning electron microscope-based techniques for microtexture analysis. It also describes how microtexture data are evaluated and represented and explores the innovative topics of orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity. Completely revised and updated, this second edition of a bestseller is a rare introductory-level guide to texture analysis. It illustrates approaches to orientation measurement and interpretation and elucidates the fundamental principles on which measurements are based. This book is an ideal tool to help you develop a working understanding of the practice and applications of texture.

Dopants And Defects In Semiconductors Second Edition

Author : Matthew D. McCluskey
ISBN : 9781351977975
Genre : Science
File Size : 58. 85 MB
Format : PDF
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Praise for the First Edition "The book goes beyond the usual textbook in that it provides more specific examples of real-world defect physics ... an easy reading, broad introductory overview of the field" ?Materials Today "... well written, with clear, lucid explanations ..." ?Chemistry World This revised edition provides the most complete, up-to-date coverage of the fundamental knowledge of semiconductors, including a new chapter that expands on the latest technology and applications of semiconductors. In addition to inclusion of additional chapter problems and worked examples, it provides more detail on solid-state lighting (LEDs and laser diodes). The authors have achieved a unified overview of dopants and defects, offering a solid foundation for experimental methods and the theory of defects in semiconductors. Matthew D. McCluskey is a professor in the Department of Physics and Astronomy and Materials Science Program at Washington State University (WSU), Pullman, Washington. He received a Physics Ph.D. from the University of California (UC), Berkeley. Eugene E. Haller is a professor emeritus at the University of California, Berkeley, and a member of the National Academy of Engineering. He received a Ph.D. in Solid State and Applied Physics from the University of Basel, Switzerland.

X Ray Diffraction Imaging

Author : Joel Greenberg
ISBN : 9780429591808
Genre : Technology & Engineering
File Size : 46. 61 MB
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This book explores novel methods for implementing X-ray diffraction technology as an imaging modality, which have been made possible through recent breakthroughs in detector technology, computational power, and data processing algorithms. The ability to perform fast, spatially-resolved X-ray diffraction throughout the volume of a sample opens up entirely new possibilities in areas such as material analysis, cancer diagnosis, and explosive detection, thus offering the potential to revolutionize the fields of medical, security, and industrial imaging and detection. Featuring chapters written by an international selection of authors from both academia and industry, the book provides a comprehensive discussion of the underlying physics, architectures, and applications of X-ray diffraction imaging that is accessible and relevant to neophytes and experts alike. Teaches novel methods for X-ray diffraction imaging Comprehensive and self-contained discussion of the relevant physics, imaging techniques, system components, and data processing algorithms Features state-of-the-art work of international authors from both academia and industry. Includes practical applications in the medical, industrial, and security sectors

Introduction To Texture Analysis

Author : Valerie Randle
ISBN : 9781482287479
Genre : Technology & Engineering
File Size : 58. 51 MB
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Encompassing the concepts, practice, and application of orientation analysis, Introduction to Texture Analysis is an essential reference source for reserachers in textiles. The author uses an accessible style to share her expertise, providing comprehensive coverage of the theory and practice of the texture techniques now available and discusses their applications in research and industry. The text considers the merits of each technique for specific applications. Case studies expand upon the author's explanations and help illustrate the main principles involved. Topics include applications of diffraction, SEM- and TEM-based techniques, and crystallographic analyses.

Combined Analysis

Author : Daniel Chateigner
ISBN : 9781118622643
Genre : Technology & Engineering
File Size : 29. 40 MB
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This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models.

Frontiers In The Design Of Materials

Author : Baldev Raj
ISBN : UVA:X030113303
Genre : Technology & Engineering
File Size : 82. 63 MB
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Contributed articles presented at the Symposium organized by Indian Institute of Metals.

Proceedings Of The Asme Materials Division

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ISBN : STANFORD:36105131805272
Genre : Technology & Engineering
File Size : 42. 48 MB
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Isij International

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ISBN : UOM:39015058748834
Genre : Iron
File Size : 31. 37 MB
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Books In Print

Author : R.R. Bowker Company
ISBN : UOM:39015054035236
Genre : American literature
File Size : 54. 75 MB
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Books in print is the major source of information on books currently published and in print in the United States. The database provides the record of forthcoming books, books in-print, and books out-of-print.

Subject Guide To Books In Print

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ISBN : STANFORD:36105025888533
Genre : American literature
File Size : 34. 60 MB
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