introduction to texture analysis macrotexture microtexture and orientation mapping second edition

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Introduction To Texture Analysis

Author : Olaf Engler
ISBN : 1420063669
Genre : Science
File Size : 48. 85 MB
Format : PDF, ePub, Mobi
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The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, practices, and applications of techniques used to determine and characterize texture. Providing a clear focus on scientific principles, this reference keeps mathematics to a minimum in covering both traditional macrotexture analysis and more modern electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book is organized into three sections: Fundamental Issues addresses terminology associated with orientations and texture, in addition to their representation. It also covers the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis. Macrotexture Analysis covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis. Microtexture Analysis provides experimental details of the transmission or scanning electron microscope-based techniques for microtexture analysis. It also describes how microtexture data are evaluated and represented and explores the innovative topics of orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity. Completely revised and updated, this second edition of a bestseller is a rare introductory-level guide to texture analysis. It illustrates approaches to orientation measurement and interpretation and elucidates the fundamental principles on which measurements are based. This book is an ideal tool to help you develop a working understanding of the practice and applications of texture.

Introduction To Texture Analysis

Author : Olaf Engler
ISBN : 1138410225
Genre :
File Size : 85. 59 MB
Format : PDF, Mobi
Download : 248
Read : 552

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The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, practices, and applications of techniques used to determine and characterize texture. Providing a clear focus on scientific principles, this reference keeps mathematics to a minimum in covering both traditional macrotexture analysis and more modern electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book is organized into three sections: Fundamental Issues addresses terminology associated with orientations and texture, in addition to their representation. It also covers the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis. Macrotexture Analysis covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis. Microtexture Analysis provides experimental details of the transmission or scanning electron microscope-based techniques for microtexture analysis. It also describes how microtexture data are evaluated and represented and explores the innovative topics of orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity. Completely revised and updated, this second edition of a bestseller is a rare introductory-level guide to

Introduction To Texture Analysis

Author : Olaf Engler
ISBN : 1420063650
Genre : Science
File Size : 68. 11 MB
Format : PDF, ePub, Mobi
Download : 672
Read : 159

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The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, practices, and applications of techniques used to determine and characterize texture. Providing a clear focus on scientific principles, this reference keeps mathematics to a minimum in covering both traditional macrotexture analysis and more modern electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book is organized into three sections: Fundamental Issues addresses terminology associated with orientations and texture, in addition to their representation. It also covers the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis. Macrotexture Analysis covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis. Microtexture Analysis provides experimental details of the transmission or scanning electron microscope-based techniques for microtexture analysis. It also describes how microtexture data are evaluated and represented and explores the innovative topics of orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity. Completely revised and updated, this second edition of a bestseller is a rare introductory-level guide to texture analysis. It illustrates approaches to orientation measurement and interpretation and elucidates the fundamental principles on which measurements are based. This book is an ideal tool to help you develop a working understanding of the practice and applications of texture.

Texture Analysis In Materials Science

Author : H.-J. Bunge
ISBN : 9781483278391
Genre : Technology & Engineering
File Size : 77. 36 MB
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Texture Analysis in Materials Science Mathematical Methods focuses on the methodologies, processes, techniques, and mathematical aids in the orientation distribution of crystallites. The manuscript first offers information on the orientation of individual crystallites and orientation distributions. Topics include properties and representations of rotations, orientation distance, and ambiguity of rotation as a consequence of crystal and specimen symmetry. The book also takes a look at expansion of orientation distribution functions in series of generalized spherical harmonics, fiber textures, and methods not based on the series expansion. The publication reviews special distribution functions, texture transformation, and system of programs for the texture analysis of sheets of cubic materials. The text also ponders on the estimation of errors, texture analysis, and physical properties of polycrystalline materials. Topics include comparison of experimental and recalculated pole figures; indetermination error for incomplete pole figures; and determination of the texture coefficients from anisotropie polycrystal properties. The manuscript is a dependable reference for readers interested in the use of mathematical aids in the orientation distribution of crystallites.

Electron Microscopy And Analysis Third Edition

Author : Peter J. Goodhew
ISBN : 0748409688
Genre : Technology & Engineering
File Size : 63. 73 MB
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Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

Image Processing

Author : Maria Petrou
ISBN : 9780470745861
Genre : Science
File Size : 26. 76 MB
Format : PDF, Kindle
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Following the success of the first edition, this thoroughly updated second edition of Image Processing: The Fundamentals will ensure that it remains the ideal text for anyone seeking an introduction to the essential concepts of image processing. New material includes image processing and colour, sine and cosine transforms, Independent Component Analysis (ICA), phase congruency and the monogenic signal and several other new topics. These updates are combined with coverage of classic topics in image processing, such as orthogonal transforms and image enhancement, making this a truly comprehensive text on the subject. Key features: Presents material at two levels of difficulty: the main text addresses the fundamental concepts and presents a broad view of image processing, whilst more advanced material is interleaved in boxes throughout the text, providing further reference for those who wish to examine each technique in depth. Contains a large number of fully worked out examples. Focuses on an understanding of how image processing methods work in practice. Illustrates complex algorithms on a step-by-step basis, and lists not only the good practices but also identifies the pitfalls in each case. Uses a clear question and answer structure. Includes a CD containing the MATLAB® code of the various examples and algorithms presented in the book. There is also an accompanying website with slides available for download for instructors as a teaching resource. Image Processing: The Fundamentals, Second Edition is an ideal teaching resource for both undergraduate and postgraduate students. It will also be of value to researchers of various disciplines from medicine to mathematics with a professional interest in image processing

Recrystallization And Related Annealing Phenomena

Author : Anthony Rollett
ISBN : 9780080982694
Genre : Science
File Size : 61. 77 MB
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Recrystallization and Related Annealing Phenomena, Third Edition, fulfills the information needs of materials scientists in both industry and academia. The subjects treated in the book are all active research areas, forming a major part of at least four regular international conference series. This new third edition ensures the reader has access to the latest findings, and is essential reading to those working in the forefront of research in universities and laboratories. For those in industry, the book highlights applications of the research and technology, exploring, in particular, the significant progress made recently in key areas such as deformed state, including deformation to very large strains, the characterization of microstructures by electron backscatter diffraction, the modeling and simulation of annealing, and continuous recrystallization. Includes over 50% of new, revised, and updated material, highlighting the significant recent literature results in grain growth in non-crystallizing systems, 3D characterization techniques, quantitative modeling techniques, and all-new appendices on texture and measurements Contains synthesized, detailed coverage from leading authors that bridge the gap between theory and practice Includes a critical level of synthesis and pedagogy with an authored rather than edited volume

Network Security

Author : Mike Speciner
ISBN : 9780132797160
Genre : Computers
File Size : 30. 16 MB
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The classic guide to network security—now fully updated!"Bob and Alice are back!" Widely regarded as the most comprehensive yet comprehensible guide to network security, the first edition of Network Security received critical acclaim for its lucid and witty explanations of the inner workings of network security protocols. In the second edition, this most distinguished of author teams draws on hard-won experience to explain the latest developments in this field that has become so critical to our global network-dependent society. Network Security, Second Edition brings together clear, insightful, and clever explanations of every key facet of information security, from the basics to advanced cryptography and authentication, secure Web and email services, and emerging security standards. Coverage includes: All-new discussions of the Advanced Encryption Standard (AES), IPsec, SSL, and Web security Cryptography: In-depth, exceptionally clear introductions to secret and public keys, hashes, message digests, and other crucial concepts Authentication: Proving identity across networks, common attacks against authentication systems, authenticating people, and avoiding the pitfalls of authentication handshakes Core Internet security standards: Kerberos 4/5, IPsec, SSL, PKIX, and X.509 Email security: Key elements of a secure email system-plus detailed coverage of PEM, S/MIME, and PGP Web security: Security issues associated with URLs, HTTP, HTML, and cookies Security implementations in diverse platforms, including Windows, NetWare, and Lotus Notes The authors go far beyond documenting standards and technology: They contrast competing schemes, explain strengths and weaknesses, and identify the crucial errors most likely to compromise secure systems. Network Security will appeal to a wide range of professionals, from those who design or evaluate security systems to system administrators and programmers who want a better understanding of this important field. It can also be used as a textbook at the graduate or advanced undergraduate level.

Electron Backscatter Diffraction In Materials Science

Author : Adam J. Schwartz
ISBN : 9781475732054
Genre : Technology & Engineering
File Size : 36. 4 MB
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Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns. The first commercially available system was introduced in 1994, and since then of sales worldwide has been dramatic. This has accompanied widening the growth applicability in materials scienceproblems such as microtexture, phase identification, grain boundary character distribution, deformation microstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can approach 50 nm, but spatial extent can be as large a centimeter or greater with a computer controlled stage and montagingofthe images. Additional benefits include the relative ease and low costofattaching EBSD hardware to new or existing SEMs. Electron backscatter diffraction is also known as backscatter Kikuchi diffraction (BKD), or electron backscatter pattern technique (EBSP). Commercial names for the automation include Orientation Imaging Microscopy (OIMTM) and Automated Crystal Orientation Mapping (ACOM).

Airport Design And Operation

Author : Antonin Kazda
ISBN : 9781784418694
Genre : Transportation
File Size : 80. 74 MB
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In this third edition the chapters have been enhanced to reflect changes in technology and the way the air transport industry runs. Key topics that are newly addressed include low cost airline operations, security issues and EASA regulations on airports. A new chapter covering extended details about wildlife control has been added to the volume.

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